Investigations of electromigration induced defects of Al-based interconnect

碩士 === 國立清華大學 === 材料科學(工程)研究所 === 84 ===

Bibliographic Details
Main Authors: Chen, Yi-Liang, 陳怡良
Other Authors: Hwang, Jenn-Chang
Format: Others
Language:zh-TW
Published: 1996
Online Access:http://ndltd.ncl.edu.tw/handle/00300945452851018447