Modeling velocity overshoot for deep-submicron VLSI MOS devices

碩士 === 國立臺灣大學 === 電機工程研究所 === 84 === This thesis presents a closed-form analytical velocity over- shoot model for 0.1 micron NMOS devices taking into account energy transport. In addition, it describes the impact of the velocity overshoot on the source-ga...

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Bibliographic Details
Main Authors: Chang,Yao-wen, 張耀文
Other Authors: James B. Kuo.
Format: Others
Language:zh-TW
Published: 1996
Online Access:http://ndltd.ncl.edu.tw/handle/74215134950940520823