EMC-driven placement for MCM

碩士 === 國立臺灣大學 === 電機工程研究所 === 84 === Due to the application of fast technologies and the increasing complexity of Multi-Chip Modules(MCM), electromagnetic interference(EMI) may reduce performance, cause logis errors, or even destroy a circu...

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Bibliographic Details
Main Authors: Tseng,Yau_Hwa, 曾耀華
Other Authors: Feng,W.S.
Format: Others
Language:zh-TW
Published: 1996
Online Access:http://ndltd.ncl.edu.tw/handle/87222918124704729826