Semiconductor Wafer Image Signal Processing and Diagnosis Platform System Design

碩士 === 中華工學院 === 航空太空工程研究所 === 85 === The traditional wafer mask alignment system utilize interferometer to make precise positioning. But the maintenance installation , and repair problems are quite complicated . This research applies image...

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Bibliographic Details
Main Authors: Yin, Li-Te, 殷立德
Other Authors: Lin Jium-Ming
Format: Others
Language:zh-TW
Published: 1997
Online Access:http://ndltd.ncl.edu.tw/handle/00646634803423783692