Noise Measurements And Analysis Of Reliability In MOSFET
碩士 === 高雄工學院 === 電機工程研究所 === 85 === As the size of the semiconductor devices is continuously scaled down and t he requirement on performance is getting higher, the reliability of devices ha s become a major issue in integrated circuits. Device degrada...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
1996
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| Online Access: | http://ndltd.ncl.edu.tw/handle/43633853552417127587 |