IDDQ Testing:A Backtracking Method to Generate Complete Test Patterns for Leakage Faults
碩士 === 國立中興大學 === 資訊科學研究所 === 85 === Within a static CMOS circuit, a lot of faults are bridging faults and leakage faults. Many researches forcus on the two fault models. And there are many methods to generate IDDQ test patterns to detect b...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1997
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| Online Access: | http://ndltd.ncl.edu.tw/handle/01215259389411270871 |