IDDQ Testing:A Backtracking Method to Generate Complete Test Patterns for Leakage Faults
碩士 === 國立中興大學 === 資訊科學研究所 === 85 === Within a static CMOS circuit, a lot of faults are bridging faults and leakage faults. Many researches forcus on the two fault models. And there are many methods to generate IDDQ test patterns to detect b...
Main Authors: | Wu, Jyh-wei, 吳志偉 |
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Other Authors: | S.J. Wang |
Format: | Others |
Language: | zh-TW |
Published: |
1997
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Online Access: | http://ndltd.ncl.edu.tw/handle/01215259389411270871 |
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