The Construction of Production Performance Prediction System for Semi-conductor Manufacturing with Artificial Neural Networks
碩士 === 國立交通大學 === 工業工程與管理學系 === 85 === The major performance measurements for any wafer fab manufactur- ing system comprise of WIP level, Move volume and cycle time. Different factors including machine breakdown, improper operation, poor releasing and dis...
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| Format: | Others |
| Language: | zh-TW |
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1997
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| Online Access: | http://ndltd.ncl.edu.tw/handle/42591376932427768873 |