Testing and Improving Testability for Synchronous Sequential Circuits
博士 === 國立交通大學 === 電子工程學系 === 85 === This dissertation studies the strategies for improving the testing efficiency and the testability for synchronous sequential circuits. In sequential circuits, some faults are hard or impossible to begenerated tests, wh...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1997
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/94236091040098644891 |