Reliability Analysis of Short-Channel P-MOSFETs
碩士 === 國立交通大學 === 電子工程學系 === 85 === In this thesis , the parameter extraction of P-MOSFETs is made first before quantitatively analyzing on the degradation of short-channel P-MOSFETs. The charge-pumping method developed by Advanced Semico...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
1997
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| Online Access: | http://ndltd.ncl.edu.tw/handle/55075540666724093170 |