Reliability Analysis of Short-Channel P-MOSFETs
碩士 === 國立交通大學 === 電子工程學系 === 85 === In this thesis , the parameter extraction of P-MOSFETs is made first before quantitatively analyzing on the degradation of short-channel P-MOSFETs. The charge-pumping method developed by Advanced Semico...
Main Authors: | Chiou, Yuh-Wen, 邱郁文 |
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Other Authors: | Ching-Yuan Wu |
Format: | Others |
Language: | zh-TW |
Published: |
1997
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Online Access: | http://ndltd.ncl.edu.tw/handle/55075540666724093170 |
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