The Impact of Back-Gate Bias on Gate current Injection in Submicron MOSFET's
碩士 === 國立交通大學 === 電子工程學系 === 85 === This thesis extensively explores the gate current by channel initated secondary electron injection(CISEI) in 0.35um gate length n-type LDD MOSFET's.The CISEI mechanism is observed to dominate...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
1997
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| Online Access: | http://ndltd.ncl.edu.tw/handle/82783093785235778755 |