A study of TDDB nd latch-up in deep submicron CMOS

碩士 === 國立交通大學 === 電子工程學系 === 85 === TDDB and latch-up in deep submicron CMOS are studied in this thesis. TDDB is discussed in the Part A with emphasis on developing a simulator for instrinsic and B-mode oxide failures. The Part B inves...

Full description

Bibliographic Details
Main Authors: Chen, Jyh-Huei, 陳志輝
Other Authors: Ming-Jer Chen
Format: Others
Language:zh-TW
Published: 1997
Online Access:http://ndltd.ncl.edu.tw/handle/00414783755408597249