A study of TDDB nd latch-up in deep submicron CMOS

A study of TDDB nd latch-up in deep submicron CMOS

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碩士 === 國立交通大學 === 電子工程學系 === 85 === TDDB and latch-up in deep submicron CMOS are studied in this thesis. TDDB is discussed in the Part A with emphasis on developing a simulator for instrinsic and B-mode oxide failures. The Part B inves...

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Bibliographic Details
Main Authors:	Chen, Jyh-Huei, 陳志輝
Other Authors:	Ming-Jer Chen
Format:	Others
Language:	zh-TW
Published:	1997
Online Access:	http://ndltd.ncl.edu.tw/handle/00414783755408597249

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