Optical Thinfilm Monitoring by Computer
碩士 === 國立中央大學 === 光電(科學)研究所 === 85 === Use computer to monitor optical thinfilnm , by the OvershootTurning Point Monitoring Method, can monitor the nonquarterwavestack of thinfilm.Using computer to help optical thinfilm process will reducethe training tim...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1997
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| Online Access: | http://ndltd.ncl.edu.tw/handle/65498180930976784168 |