Complete Interconnect BIST Using IEEE 1149 Boundary Scan
碩士 === 國立中央大學 === 電機工程學系 === 85 === In this paper, we will present a BIST methodology for board and system levels interconnect based on IEEE 1149.1 and IEEE 1149.5 Boundary Scan standards. We target at systems with optional cards. We will p...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1997
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| Online Access: | http://ndltd.ncl.edu.tw/handle/95648108283267675920 |