An Investigation of Polarization Fatigue for Ferroelectric Thin Film Capacitors

碩士 === 國立清華大學 === 物理學系 === 85 === The effect of fatigue on the leakage current of PZT thin film capacitorswas analyzed. The change of polarization is correlated to the stresselectric field and the fatigue cycles. It is found that there is n...

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Bibliographic Details
Main Authors: He, Tsung-Hsin, 何宗欣
Other Authors: Ying-Chuan Yang, Joseph Ya-min Lee
Format: Others
Language:zh-TW
Published: 1997
Online Access:http://ndltd.ncl.edu.tw/handle/82830427533488370200