The Fabrication and Reliability Testing of Deep-Submicron TiW/ TiSi2 Contacts

碩士 === 國立清華大學 === 電機工程研究所 === 85 ===

Bibliographic Details
Main Authors: Chen, Li-Ren, 陳立仁
Other Authors: Xu, Yong-Zhen
Format: Others
Language:zh-TW
Published: 1997
Online Access:http://ndltd.ncl.edu.tw/handle/21167743198567226877