Study on the Cause to Voltage-Hike in Li-Al/FeS2 Battery

碩士 === 國立臺灣大學 === 化學工程學系 === 85 === Based on XPS (x-ray photoelectron spectroscopy), IC (ion chromatography), SEM (scanning electron microscope), XRD (x-ray-diffraction) and single-cell tester analyses, it was identified that the occurrence of the vo...

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Bibliographic Details
Main Authors: Chiu, Chih-Cheng, 邱志誠
Other Authors: Wu Nae-lih
Format: Others
Language:zh-TW
Published: 1997
Online Access:http://ndltd.ncl.edu.tw/handle/67659243806900139685