A COST-EFFECTIVE METHODOLOGY FOR A RUN-BY-RUN EWMA CONTROLLER
碩士 === 國立臺灣大學 === 商學研究所 === 85 === As the competition in semiconductor market is getting more and more severe, quality improvement in manufacturing has become an important source of competitive advantage. During IC fabrication in a wafer fab, wafer outpu...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
1997
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| Online Access: | http://ndltd.ncl.edu.tw/handle/46416386368512376478 |