Parameter Settings of Vision Inspection Machine in IC Package Process

碩士 === 朝陽大學 === 工業工程與管理研究所 === 86 === Due to high automation of manufacturing equipment, high speed of production rates, and small and precise specifications of basic components in IC package process, the inspection operations have used computer vision te...

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Bibliographic Details
Main Authors: Chu, Ta-Hung, 朱達宏
Other Authors: Lin, Hong-Dar
Format: Others
Language:zh-TW
Published: 1998
Online Access:http://ndltd.ncl.edu.tw/handle/90154700268486232037