Functional Testing for Cache Memory Systems

碩士 === 國立成功大學 === 電機工程學系 === 86 === In this thesis, an efficient test algorithm for on-chip caches is proposed. In this algorithm, the processor on a chip is controlled by a test program and acts as a test controller to activate fault effec...

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Bibliographic Details
Main Authors: Huang, Min-Cheng, 黃敏政
Other Authors: Lee Kuen-Jong
Format: Others
Language:zh-TW
Published: 1998
Online Access:http://ndltd.ncl.edu.tw/handle/49165383347271627664