Studies on RHEED Oscillations of Laser MBE system

碩士 === 國立交通大學 === 電子物理學系 === 86 === The Reflection High Energy Electron Diffraction is used to in-situlymonitor the evolution of thin film growth in our Laser MBE system. So far, wehave successfully observed the RHEED oscillations of S...

Full description

Bibliographic Details
Main Authors: Ou, Jun-Hong, 歐俊宏
Other Authors: Yih-Shun Gou
Format: Others
Language:zh-TW
Published: 1998
Online Access:http://ndltd.ncl.edu.tw/handle/68227090340996223272