Study on electrical and structural properties of low temperature boron-and phosphorus-doped polycrystalline silicon thin films prepared by ECR-CVD

碩士 === 國立清華大學 === 電機工程研究所 === 86 ===

Bibliographic Details
Main Authors: Xie, Yong-Yan, 謝永堰
Other Authors: Huang, Hui-Liang
Format: Others
Language:en_US
Published: 1998
Online Access:http://ndltd.ncl.edu.tw/handle/91026061738164382987