Testable Design and Implementation for a Microcontroller
碩士 === 國立中正大學 === 資訊工程研究所 === 87 === In this thesis, we present a testable design and implementation for a microcontroller. The microcontroller is generally divided into two types of circuits for test. For regular structure, memory BIST technology is applied while full scan test is used f...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
1999
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| Online Access: | http://ndltd.ncl.edu.tw/handle/29231656352007877937 |