Randomization on Testing in Digital Sequential Logic Circuits
碩士 === 中華大學 === 電機工程學系碩士班 === 87 === Randomization on testing in sequential logic circuits is more complicated and difficult than that on combinational logic circuits. In this thesis, it aims to adopt the method of Markov chain to analyze the random testability for detecting a fault in ci...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1999
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/54400850713916137407 |