Application of Discriminant Analysis to parametric testing
碩士 === 中華大學 === 電機工程學系碩士班 === 87 === Generally, when a chip is under testing, the most direct method is to generate a test pattern, and then drives the test pattern to the chip input. Check the measurement result compared with the desired one and to decide the chip is good or faulty. In this thesis,...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
1999
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| Online Access: | http://ndltd.ncl.edu.tw/handle/11820415742995225567 |