The Detection and Classification of Lead Frame Defects Using Neural Networks
碩士 === 中華大學 === 機械與航太工程研究所 === 87 === As the pitch getting finer and the lead number getting higher, the inspection of IC lead frame using bare eyes becomes more difficult. To lessen the workload of human inspectors, an effective method for the detection and classification of defects is presented. F...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1999
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| Online Access: | http://ndltd.ncl.edu.tw/handle/44883327211863894990 |