The post annealing effect in exchange biasing field of NiFe/NiFeMn system

碩士 === 國立成功大學 === 物理學系 === 87 === We have grown the high quality NiFe/NiFeMn thin film system by MBE to study the exchange biasing effect. Choosing different composition, growth temperature and thickness of NiFeMn to examine how it affects the exchange biasing field. Using X-ray diffraction, magneto...

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Bibliographic Details
Main Authors: L.J. Jeng, 鄭立專
Other Authors: J.C.A. Huang
Format: Others
Language:zh-TW
Published: 1999
Online Access:http://ndltd.ncl.edu.tw/handle/22278345765045800082