Application of the TOC’s Aggregated Buffer to the Due Date Control in the Semiconductor Wafer Fabrication
碩士 === 國立交通大學 === 工業工程與管理系 === 87 === Due-date performance is one of the most important production performance indexes in wafer fabrication industry. This study try to develop a new method of shop flow scheduling for improves missed due-date performance. The traditional methods were addressed on cyc...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1999
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/94250628717060799128 |