The Characterization of Pure Metal Targets AID Deposited TiZrN Thin Film

碩士 === 國立交通大學 === 材料科學與工程系 === 87 === In this study it tried to deposit TiZrN thin films on SKD11 steels and 304 stainless steels in the way of arc ion plating by pure Ti and Zr metals and studied in the effects of various process parameters for coatings. In analysis, the structures, comp...

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Main Authors: Tin-How Kuo, 郭庭豪
Other Authors: Char-Fu Chen
Format: Others
Language:zh-TW
Published: 1999
Online Access:http://ndltd.ncl.edu.tw/handle/23938132663383407002
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spelling ndltd-TW-087NCTU01590392015-10-13T12:46:52Z http://ndltd.ncl.edu.tw/handle/23938132663383407002 The Characterization of Pure Metal Targets AID Deposited TiZrN Thin Film 純金屬陰極多弧離子沉積TiZrN薄膜特性之研究 Tin-How Kuo 郭庭豪 碩士 國立交通大學 材料科學與工程系 87 In this study it tried to deposit TiZrN thin films on SKD11 steels and 304 stainless steels in the way of arc ion plating by pure Ti and Zr metals and studied in the effects of various process parameters for coatings. In analysis, the structures, compositions of the coatings were studied by means of XRD,GDS,SEM and EDS. Vickers micro-hardness indentation and Rockswell hardness indentation were used to measure the hardness and adhesion of coatings. The roughness of coatings surface was determined by α-stepper. In SEM analysis we knew that there are obviously column structure in coatings in low N2 pressure, high arc currents and high substrate bias voltages. In GDS and EDS analysis, we knew that the components of coatings were so uniform. The solution of XRD analysis showed that there are three different phases, TiZrN, TiN and ZrN, in the coatings. All of them were (111) orientated, and the angles of TiZrN(111) diffraction peaks were between 34.211O and 35.449O . In various process parameters, the values of coatings surface roughness are between 254nm and 530nm. With increasing of targets current from single Ti target 40A to double Ti targets 90A, the rate of Ti/Zr increased from 0.25/0.75 to 0.7/0.3. In listed parameters: N2 Pressure was 2Pa, the Zr target current was 90A, both Ti targets current were 40A and the potential of substrate was -200V, the value of Ti/Zr was 0.45/0.55, and there was the highest value in hardness,3452Hv0.05. Char-Fu Chen 陳家富 1999 學位論文 ; thesis 97 zh-TW
collection NDLTD
language zh-TW
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sources NDLTD
description 碩士 === 國立交通大學 === 材料科學與工程系 === 87 === In this study it tried to deposit TiZrN thin films on SKD11 steels and 304 stainless steels in the way of arc ion plating by pure Ti and Zr metals and studied in the effects of various process parameters for coatings. In analysis, the structures, compositions of the coatings were studied by means of XRD,GDS,SEM and EDS. Vickers micro-hardness indentation and Rockswell hardness indentation were used to measure the hardness and adhesion of coatings. The roughness of coatings surface was determined by α-stepper. In SEM analysis we knew that there are obviously column structure in coatings in low N2 pressure, high arc currents and high substrate bias voltages. In GDS and EDS analysis, we knew that the components of coatings were so uniform. The solution of XRD analysis showed that there are three different phases, TiZrN, TiN and ZrN, in the coatings. All of them were (111) orientated, and the angles of TiZrN(111) diffraction peaks were between 34.211O and 35.449O . In various process parameters, the values of coatings surface roughness are between 254nm and 530nm. With increasing of targets current from single Ti target 40A to double Ti targets 90A, the rate of Ti/Zr increased from 0.25/0.75 to 0.7/0.3. In listed parameters: N2 Pressure was 2Pa, the Zr target current was 90A, both Ti targets current were 40A and the potential of substrate was -200V, the value of Ti/Zr was 0.45/0.55, and there was the highest value in hardness,3452Hv0.05.
author2 Char-Fu Chen
author_facet Char-Fu Chen
Tin-How Kuo
郭庭豪
author Tin-How Kuo
郭庭豪
spellingShingle Tin-How Kuo
郭庭豪
The Characterization of Pure Metal Targets AID Deposited TiZrN Thin Film
author_sort Tin-How Kuo
title The Characterization of Pure Metal Targets AID Deposited TiZrN Thin Film
title_short The Characterization of Pure Metal Targets AID Deposited TiZrN Thin Film
title_full The Characterization of Pure Metal Targets AID Deposited TiZrN Thin Film
title_fullStr The Characterization of Pure Metal Targets AID Deposited TiZrN Thin Film
title_full_unstemmed The Characterization of Pure Metal Targets AID Deposited TiZrN Thin Film
title_sort characterization of pure metal targets aid deposited tizrn thin film
publishDate 1999
url http://ndltd.ncl.edu.tw/handle/23938132663383407002
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