Design for Testability and Test Strategies of Multichip Modules
博士 === 國立交通大學 === 資訊科學系 === 87 === The goal of this thesis is to develop efficient DFT (design for testability) and test strategies for MCMs (multichip modules) during their production and test processes. In CMOS MCMs, partitioning a circuit into modules before using a separate...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
1999
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| Online Access: | http://ndltd.ncl.edu.tw/handle/71853348323170915662 |