Integration of Automatic Test Program Generator and Coverage Tool
碩士 === 國立交通大學 === 資訊科學系 === 87 === VLSI design and manufacturing technologies progress very fast nowadays. Verification becomes harder as VLSI designs, such as a superscalar microprocessor design, tend to be more complex. Traditional randomly test program generators have some problems, su...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
1999
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| Online Access: | http://ndltd.ncl.edu.tw/handle/26900664618365816622 |