Investigation of Hot-Carrier Injection Induced Reliability Issues in Flash Memories
博士 === 國立交通大學 === 電子工程系 === 87 === Hot carrier induced reliability issues have become increasingly important for miniaturized flash memory design. These reliability issues include hot carrier related issues, such as oxide damage, program/erase cycling endurance, disturbance, and data retention. In t...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
1999
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| Online Access: | http://ndltd.ncl.edu.tw/handle/73427801549497138777 |