Characteristics of CVD TEOS Oxide Deposited on Disilane Polysilicon and Stacked Polysilicon Films

碩士 === 國立交通大學 === 電子工程系 === 87 === In this thesis, we investigate the CVD TEOS polyoxides deposited on disilane polysilicon films and stacked polysilicon films with rapid thermal N2O (RTN2O) annealing. It is found that the smoother polysilicon/polyoxide interface can be obtained by replac...

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Bibliographic Details
Main Authors: Won-Der Chen, 陳萬得
Other Authors: Tan-Fu Lei
Format: Others
Language:en_US
Published: 1999
Online Access:http://ndltd.ncl.edu.tw/handle/40679578418224433911