Improved Performance and Reliability of N-channel Flash Memories with P-type Floating-gate Material
碩士 === 國立交通大學 === 電子工程系 === 87 === Recently, the flash memory has been widely employed in nonvolatile semiconductor memories. For the design of advanced flash memories, the performance and reliability are the major concern. In the past, the design of flash memories is mainly focused on th...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1999
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| Online Access: | http://ndltd.ncl.edu.tw/handle/73512624942781380900 |