The azimuthal alignment and application of the Photoelastic Modulation Ellipsometry
碩士 === 國立交通大學 === 光電工程所 === 87 === Other than nulling method, we propose a three-intensity-measurement technique to determine the azimuth deviation of polarizer (P), photoeiastic modulator(PEM) and analyzer(A) to the surface of incidence. We first used a straight-through set-up to align the relativ...
Main Authors: | Shing Liu, 劉行 |
---|---|
Other Authors: | Yu-Faye Chao |
Format: | Others |
Language: | zh-TW |
Published: |
1999
|
Online Access: | http://ndltd.ncl.edu.tw/handle/87192056884122658785 |
Similar Items
-
The azimuthal alignment and application of Photoelastic modulator system
by: Charn-Kuo Wang, et al. -
Azimuthal alignment in ellipsometry and it''s measurements
by: WEI, ZHI-XING, et al.
Published: (1993) -
Photoelastic modulated imaging ellipsometry
by: Chia-Luen Lee, et al.
Published: (2005) -
Multi-wavelength Photoelastic Modulation Ellipsometry
by: Meng-Wei Wang, et al.
Published: (2004) -
Study the twist nematic liquid crystal by photoelastic modulated ellipsometry
by: Chun-Kai Chang, et al.
Published: (2005)