The study of the process parameters of Si1-xGex/Si thin film with reactive ion etching technology

碩士 === 國立中山大學 === 材料科學研究所 === 87 ===

Bibliographic Details
Main Authors: yinming Tseng, 曾盈銘
Other Authors: k. Y. Hsieh
Format: Others
Language:zh-TW
Published: 1999
Online Access:http://ndltd.ncl.edu.tw/handle/48100140997640284252