Effects of Stress on Formation of Cobalt Silicides

碩士 === 國立清華大學 === 材料科學工程學系 === 87 === The effects of stress on the formation of cobalt silicides have been investigated by sheet resistance measurements, glancing-angle x-ray diffraction analysis and transmission electron microscopy. The tensile stress present in the silicon substrate was...

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Bibliographic Details
Main Authors: Chien-Chien Tsai, 蔡蒨蒨
Other Authors: Lih-Juann Chen
Format: Others
Language:en_US
Published: 1999
Online Access:http://ndltd.ncl.edu.tw/handle/48723571068468950773