Development of the AlN/TaN and AlON/TaON Multilayer Films for the Attenuated Phase Shifting Mask

碩士 === 大同工學院 === 材料工程研究所 === 87 === We prepared AlN/TaN and AlON/TaON multilayer films by use of R.F magnetron sputtering system. By adjusting the material stoichiometry through controlled of sputter deposition parameters, those films could be tailored for specific optical application. Su...

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Bibliographic Details
Main Authors: Wen-Pin Wu, 吳文斌
Other Authors: Fu-Der Lai
Format: Others
Language:en_US
Published: 1999
Online Access:http://ndltd.ncl.edu.tw/handle/72094593130884155125