WMG：A Wafer Map Generator by Disseminating Defect Patterns
碩士 === 中華大學 === 電機工程學系碩士班 === 88 === In this thesis, we analyze defect patterns on a Wafer Map by the way of disintegrating polyominoes patterns. After disintegrating, these ones can be recorded by different coefficients. According to the values, random disseminating polyonimoes patterns to another...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2000
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| Online Access: | http://ndltd.ncl.edu.tw/handle/02239502131493825842 |