A Case Study of Failure Analysis and Guardband Determination for a 64M-bit DRAM
碩士 === 中華大學 === 電機工程學系碩士班 === 88 === The chips with defects, which escape the test, will cause the quality problem and will hurt the goodwill and decline the revenue. It is important to look for the defect root causes and to derive the prevention strategy. In this paper, a case study of a 64M-DRAM...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2000
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| Online Access: | http://ndltd.ncl.edu.tw/handle/54145104144756906419 |