Inspection of Fabric Defects Using Wavelet Analysis
博士 === 逢甲大學 === 紡織工程學系 === 88 === Multiresolution representation of an image using wavelet analysis is a new and effective approach for the analysis of image information content, and artificial neural network (ANN) has the ability of fault tolerance and learning. In this study we combine the advanta...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2000
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| Online Access: | http://ndltd.ncl.edu.tw/handle/52583732127230622433 |