A Study of Ultra Shallow p+/n Junction by Low Energy Ion Implantation

碩士 === 逢甲大學 === 電機工程學系 === 88 === In the thesis, The application for p+/n ultra shallow junction formed with low energy F+ ion implantation were investigated. A junction depth as shallow as 0.052um was obtained by using the lower energy F+ pre-implantation process and the junction depth d...

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Bibliographic Details
Main Authors: Hung Yu Ming, 洪裕明
Other Authors: W.L.Yang
Format: Others
Language:zh-TW
Published: 2000
Online Access:http://ndltd.ncl.edu.tw/handle/75788855652672363303