Studies of surface state density of semiconductors by photoreflectance
碩士 === 國立成功大學 === 物理學系 === 88 === This work uses photoreflectance (PR) to investigate the band gap, built-in electric field, and surface Fermi level of a series of lattice-matched In0.52Al0.48As surface intrinsic-n+ structures having different undoped layer thickness. Experimental results indicate t...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2000
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| Online Access: | http://ndltd.ncl.edu.tw/handle/19580203110962078138 |