A Study on Automatic Inspection of

碩士 === 國立成功大學 === 電機工程學系 === 88 === Abstract This thesis implements an inspection system to examine the quality of IC printed mark. The main defects of IC printed mark include: missing ink, double print, extra ink, broken, smeared and ink splashed. The traditional inspection is manua...

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Bibliographic Details
Main Authors: Ying-Chang Wu, 吳盈璋
Other Authors: Chin-Hsing Chen
Format: Others
Language:en_US
Published: 2000
Online Access:http://ndltd.ncl.edu.tw/handle/35006779473439094144