The Design of Inventory Control Model for Dummy/Control Wafers at the Furnace Area in the Wafer Fab
碩士 === 國立交通大學 === 工業工程與管理系 === 88 === The profit of semiconductor manufacturing is related to yield of wafers. Dummy/control (C/D) wafer is used as an important tool to maintain and to improve yield of wafer production. In many real fab, unreasonable high WIP level of C/D wafer is maintained for pr...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2000
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| Online Access: | http://ndltd.ncl.edu.tw/handle/95185846471460282025 |