Solving Burn-In Oven Assignment Problem by Genetic Algorithms Combined with Other Heuristic Algorithms
碩士 === 國立交通大學 === 資訊管理所 === 88 === Burn-in is usually the first and critical process in IC testing. Because of the concern of batch processing property of burn-in ovens and the number of burn-in boards, it''s not only a sequencing but also an assignment problem while scheduling. Although i...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2000
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| Online Access: | http://ndltd.ncl.edu.tw/handle/47855120209879239724 |