Timing Generator for the Application of the Automatic Test Equipment
碩士 === 國立中央大學 === 電機工程研究所 === 88 === Timing generator is an important building block in Auto Test Equipment (ATE). Conventionally, it is implemented by a mixture of semiconductor technologies such as ECL or GaAs. Today, for the cost and power consumption reduction, CMOS technology is an...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2000
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/05266876841451993330 |