The Oxidation Behaviors of MoSi2 and WSi2 on Single Crystalline Si and Polycrystalline Si

博士 === 國立清華大學 === 材料科學工程學系 === 88 === The Oxidation Behaviors of MoSi2 and WSi2 on Single Crystalline Si and Polycrystalline Si have been carried out. For 180 nm thick MoSi2 layer on (111)Si, a high density of defects was found to form in silicon in samples oxidized in wet O2. The defects were ident...

Full description

Bibliographic Details
Main Authors: Shue-Fu Hung, 洪旭甫
Other Authors: Lih-Juann Chen
Format: Others
Language:en_US
Published: 1999
Online Access:http://ndltd.ncl.edu.tw/handle/79211081322012997688